	Innovative Measurement Solutions Omniscan
HOME APPLICATIONS -Nanoscale surface science -Nanoscale topography -Microscale topography -Flatness/Waviness -Thin-film characterisation -Surface manipulation PRODUCTS -DualScope -MicroXAM -MiniFIZ -OSP100/500 -XP-2/XP-1 -nkd7000/8000 -uPG101/DWL66 TECHNOLOGIES - SP M - White light interferometry - Laser interferometry - Laser/confocal scanning - Stylus profiling - Spectrophotometry - Laser lithography CONTACT Click on one of the above	OSP series of non-contact, large area surface profilers. The Uniscan model OSP100A is a 3D Laser Profilometer designed for high accuracy non-contact measurement of surface topography profile, form and texture measurement. Utilising a variety of laser or white-light displacement sensors, the OSP100A measures surface topography in the range 10's of millimetres to sub-micrometers, over area's up to 100mm x 75mm. The OSP100A is a cost effective, bench top profilometer with a very high level of performance. The Uniscan 3D Laser Profilometer, model OSP500LM is designed for very fast, high accuracy non-contact measurement of surface topography profile, form and texture measurement over large area's. Utilising a laser displacement sensor, the OSP500LM measures surface topography in the range 10's of millimeters to sub-micrometers, over area's up to 500mm x 500mm. All non-contact surface measurement scanning and data acquisition parameters are controlled by the Windows™ 32 bit MDI software. Real time surface topography data is displayed in graph and colour contour formats. Accurate laser profilometer probe positioning is achieved using linear encoders on all scan axes. Post acquisition analysis on recorded non-contact surface measurement profiles includes digital filtering options, tilt removal, arithmetic, statistics and auto-thresholding. The stored surface profile data matrices can be exported directly to other software or computer aided manufacturing (CAM) systems in a variety of formats.

Innovative Measurement Solutions

Omniscan

APPLICATIONS
-Nanoscale surface science
-Nanoscale topography
-Microscale topography
-Flatness/Waviness
-Thin-film characterisation
-Surface manipulation

PRODUCTS
-DualScope
-MicroXAM
-MiniFIZ
-OSP100/500
-XP-2/XP-1
-nkd7000/8000
-uPG101/DWL66

TECHNOLOGIES
- SP M
- White light interferometry
- Laser interferometry
- Laser/confocal scanning
- Stylus profiling
- Spectrophotometry
- Laser lithography

CONTACT

Click on one of the above

OSP series of non-contact, large area surface profilers.

The Uniscan model OSP100A is a 3D Laser Profilometer designed for high accuracy non-contact measurement of surface topography profile, form and texture measurement. Utilising a variety of laser or white-light displacement sensors, the OSP100A measures surface topography in the range 10's of millimetres to sub-micrometers, over area's up to 100mm x 75mm. The OSP100A is a cost effective, bench top profilometer with a very high level of performance.

The Uniscan 3D Laser Profilometer, model OSP500LM is designed for very fast, high accuracy non-contact measurement of surface topography profile, form and texture measurement over large area's. Utilising a laser displacement sensor, the OSP500LM measures surface topography in the range 10's of millimeters to sub-micrometers, over area's up to 500mm x 500mm.

All non-contact surface measurement scanning and data acquisition parameters are controlled by the Windows™ 32 bit MDI software. Real time surface topography data is displayed in graph and colour contour formats. Accurate laser profilometer probe positioning is achieved using linear encoders on all scan axes. Post acquisition analysis on recorded non-contact surface measurement profiles includes digital filtering options, tilt removal, arithmetic, statistics and auto-thresholding. The stored surface profile data matrices can be exported directly to other software or computer aided manufacturing (CAM) systems in a variety of formats.