	Innovative Measurement Solutions Omniscan
HOME APPLICATIONS -Nanoscale surface science -Nanoscale topography -Microscale topography -Flatness/Waviness -Thin-film characterisation -Surface manipulation PRODUCTS -DualScope -MicroXAM -OptiFLAT -OSP100/500 -Alpha-Step/P-16+ -F10/20/30/40/50 -uPG101/DWL66 TECHNOLOGIES - SP M - White light interferometry - Laser/confocal scanning - Stylus profiling - Spectrophotometry - Laser lithography CONTACT Click on one of the above	MiniFIZ – Fizeau interferometer MiniFIZ-100 with wavelength shifitng option and MiniFIZ-300 models. MiniFIZ is a laser-based instrument capable of sub-nanometer non-contact surface metrology. Featuring a modular structure, which allows customization to any application, MiniFIZ always reflects the highest standards of accuracy, durability, and speed. MiniFIZ assesses flatness, sphericity and wavefront transmission. Special applications are already available for the optics industry: super-accurate testing of prisms, corner cubes, flats and radius of curvature. In the hard disk industry, flatness and static RVA analysis application options are used on high volume production lines for process control. Results from the measurement of a diamond turned surface. MiniFIZ's modular structure allows the purchase of a system tailored for every need. Choose from 50, 100, or 150mm (2", 4", and 6") apertures for a full variety of applications. Enjoy the flexibility of 100mm and 150mm apertures in one instrument with the 4 to 6" Aperture Converter Accessory. Physical features Stable, stiff rail structure allows measurements without the use of an air table. Some mounts allow vertical testing. Stress-free, repeatable mounting— no need for constant fine adjustment. Total unit has a small footprint and is lightweight. Horizontal or vertical operation. Stabilized laser prevents light level variations, allows testing over long path lengths. Easily integrates into automated process lines. Software features Software monitoring of environment prevents corrupted measurements. Advanced algorithms minimize measurement error due to vibration. Complete, selectable RVA software analysis available. Pentium based system insures compatibility and future upgrades. Large area waviness measurement. Below are links for other interferometer setups, for measuring different kinds of surface figures. Interferometer setups Flatness measurements Concave measurements

Innovative Measurement Solutions

Omniscan

APPLICATIONS
-Nanoscale surface science
-Nanoscale topography
-Microscale topography
-Flatness/Waviness
-Thin-film characterisation
-Surface manipulation

PRODUCTS
-DualScope
-MicroXAM
-OptiFLAT
-OSP100/500
-Alpha-Step/P-16+
-F10/20/30/40/50
-uPG101/DWL66

TECHNOLOGIES
- SP M
- White light interferometry
- Laser/confocal scanning
- Stylus profiling
- Spectrophotometry
- Laser lithography

CONTACT

Click on one of the above

MiniFIZ – Fizeau interferometer

MiniFIZ-100 with wavelength shifitng option and MiniFIZ-300 models.

MiniFIZ is a laser-based instrument capable of sub-nanometer non-contact surface metrology. Featuring a modular structure, which allows customization to any application, MiniFIZ always reflects the highest standards of accuracy, durability, and speed.

MiniFIZ assesses flatness, sphericity and wavefront transmission. Special applications are already available for the optics industry: super-accurate testing of prisms, corner cubes, flats and radius of curvature. In the hard disk industry, flatness and static RVA analysis application options are used on high volume production lines for process control.

Results from the measurement of a diamond turned surface.

MiniFIZ's modular structure allows the purchase of a system tailored for every need. Choose from 50, 100, or 150mm (2", 4", and 6") apertures for a full variety of applications. Enjoy the flexibility of 100mm and 150mm apertures in one instrument with the 4 to 6" Aperture Converter Accessory.

Physical features

Stable, stiff rail structure allows measurements without the use of an air table.
Some mounts allow vertical testing.
Stress-free, repeatable mounting— no need for constant fine adjustment.
Total unit has a small footprint and is lightweight.
Horizontal or vertical operation.
Stabilized laser prevents light level variations, allows testing over long path lengths.
Easily integrates into automated process lines.

Software features

Software monitoring of environment prevents corrupted measurements.
Advanced algorithms minimize measurement error due to vibration.
Complete, selectable RVA software analysis available.
Pentium based system insures compatibility and future upgrades.

Large area waviness measurement.

Below are links for other interferometer setups, for measuring different kinds of surface figures.

Interferometer setups
Flatness measurements
Concave measurements