	Innovative Measurement Solutions Omniscan
HOME APPLICATIONS -Nanoscale surface science -Nanoscale topography -Microscale topography -Flatness/Waviness -Thin-film characterisation -Surface manipulation PRODUCTS -DualScope -ZeMapper -ZeScope -OSP100/500 -F10/20/30/40/50 -uPG101/DWL66 TECHNOLOGIES - SP M - White light interferometry - Laser/confocal scanning - Spectrophotometry - Laser lithography CONTACT Click on one of the above	Filmetrics offer a full range of instruments that connect to your XP- or Vista-based computer, as well as optional accessories that fill your measurement needs. Filmetrics also provides dozens of custom configurations, so please call us if you don’t find what you are looking for below. Affordable System for Analyzing AR Coatings and Measuring Hardcoat Thickness. The F10-AR measures hardcoat thickness and analyzes antireflective coatings on a wide variety of substrates to determine conformance to user-provided specifications. Simultaneous Reflectance and Transmittance for Vacuum Coatings. The F10-VC measures reflectance and transmittance simultaneously and is designed especially for vacuum coating applications. This low-cost system can be upgraded with film thickness and index solving modules. Table-Top Systems for Thickness and Index Measurements. These are our workhorse general-purpose instruments suitable for a wide range of applications. Choose the F20 system (F20-UV, F20, F20-NIR, or F20-EXR) with the best thickness or wavelength range for your application. More specialized F20 systems are optimized for the measurement of automotive hardcoats and opthalmic lenses and extra thick (? 0.45mm) films (F20-XT). Photonics Circle of Excellence Award Winner Small-Spot-Size Thickness Measurements. The F40 turns your microscope into a film-thickness measurement tool. For thickness measurements on patterned surfaces and other applications that require a spot size as small as 10 microns. Map Thicknesses of Microscopic Areas. Thickness is easily mapped using the Filmetrics F42 spectral-reflectance-based system. In-situ Deposition and Etch Monitor. The F30 measures deposition rates, layer thickness, optical constants (n and k) and uniformity of semiconductor and dielectric layers in real time. R&D 100 Award Winner

Innovative Measurement Solutions

Omniscan

APPLICATIONS
-Nanoscale surface science
-Nanoscale topography
-Microscale topography
-Flatness/Waviness
-Thin-film characterisation
-Surface manipulation

PRODUCTS
-DualScope
-ZeMapper
-ZeScope
-OSP100/500
-F10/20/30/40/50
-uPG101/DWL66

TECHNOLOGIES
- SP M
- White light interferometry
- Laser/confocal scanning
- Spectrophotometry
- Laser lithography

CONTACT

Click on one of the above

Filmetrics offer a full range of instruments that connect to your XP- or Vista-based computer, as well as optional accessories that fill your measurement needs. Filmetrics also provides dozens of custom configurations, so please call us if you don’t find what you are looking for below.

Affordable System for Analyzing AR Coatings and Measuring Hardcoat Thickness. The F10-AR measures hardcoat thickness and analyzes antireflective coatings on a wide variety of substrates to determine conformance to user-provided specifications.

Simultaneous Reflectance and Transmittance for Vacuum Coatings. The F10-VC measures reflectance and transmittance simultaneously and is designed especially for vacuum coating applications. This low-cost system can be upgraded with film thickness and index solving modules.

Table-Top Systems for Thickness and Index Measurements. These are our workhorse general-purpose instruments suitable for a wide range of applications. Choose the F20 system (F20-UV, F20, F20-NIR, or F20-EXR) with the best thickness or wavelength range for your application. More specialized F20 systems are optimized for the measurement of automotive hardcoats and opthalmic lenses and extra thick (? 0.45mm) films (F20-XT). Photonics Circle of Excellence Award Winner

Small-Spot-Size Thickness Measurements. The F40 turns your microscope into a film-thickness measurement tool. For thickness measurements on patterned surfaces and other applications that require a spot size as small as 10 microns.

Map Thicknesses of Microscopic Areas. Thickness is easily mapped using the Filmetrics F42 spectral-reflectance-based system.

In-situ Deposition and Etch Monitor. The F30 measures deposition rates, layer thickness, optical constants (n and k) and uniformity of semiconductor and dielectric layers in real time. R&D 100 Award Winner