	Innovative Measurement Solutions Omniscan
HOME APPLICATIONS -Nanoscale surface science -Nanoscale topography -Microscale topography -Flatness/Waviness -Thin-film characterisation -Surface manipulation PRODUCTS -DualScope -MicroXAM -OptiFLAT -OSP100/500 -Alpha-Step/P-16+ -F10/20/30/40/50 -uPG101/DWL66 TECHNOLOGIES - SP M - White light interferometry - Laser/confocal scanning - Stylus profiling - Spectrophotometry - Laser lithography CONTACT Click on one of the above	DualScope and RasterScope Scanning Probe Microscope (SPM) systems. Scanning Probe Microscopes have the ability to make sub-nanometer (and in some cases atomic scale) measurements of surface topopgraphy, electrical properties and optical properties of a wide variety of sample surfaces and is the instrument of choice for three dimensional measurements at the nanometer scale. With an SPM system you can perform measurements in air, vacuum, or fluid and on both hard and soft surfaces. The DualScope and Rasterscope SPM products can be divided into three main groups: Atomic Force Microscopes – AFM Scanning Nearfield Optical Microscopes - SNOM Scanning Tunnelling Microscopes – STM A few examples of instrument congifurations are shown below: The innovative spirit that drives DME is reflected in all their SPM products and helps them to deliver instruments that have the minimum of complexity but give the maximum performance. Applications: below are a few examples, more can be found here. Data storage Optical characterisation - Topographical (left) and near-field optical (right) images. Materials science Once you have defined your research area and requirements, we put together an SPM system for you that is designed to meet your needs. All of our scanners, controllers, and stages can be integrated into unique configurations designed to scan, image and measure the sample surface you want to characterise. Because not everyone needs an "off the shelf" instrument we are also able to offer highly customised solutions such as the PolyScope UHV STM and the CAHT controlled atmosphere at high temperature SPM – for more information please contact us to discss your requirements.

Innovative Measurement Solutions

Omniscan

APPLICATIONS
-Nanoscale surface science
-Nanoscale topography
-Microscale topography
-Flatness/Waviness
-Thin-film characterisation
-Surface manipulation

PRODUCTS
-DualScope
-MicroXAM
-OptiFLAT
-OSP100/500
-Alpha-Step/P-16+
-F10/20/30/40/50
-uPG101/DWL66

TECHNOLOGIES
- SP M
- White light interferometry
- Laser/confocal scanning
- Stylus profiling
- Spectrophotometry
- Laser lithography

CONTACT

Click on one of the above

DualScope and RasterScope Scanning Probe Microscope (SPM) systems.

Scanning Probe Microscopes have the ability to make sub-nanometer (and in some cases atomic scale) measurements of surface topopgraphy, electrical properties and optical properties of a wide variety of sample surfaces and is the instrument of choice for three dimensional measurements at the nanometer scale. With an SPM system you can perform measurements in air, vacuum, or fluid and on both hard and soft surfaces.

The DualScope and Rasterscope SPM products can be divided into three main groups:

Atomic Force Microscopes – AFM
Scanning Nearfield Optical Microscopes - SNOM
Scanning Tunnelling Microscopes – STM

A few examples of instrument congifurations are shown below:

The innovative spirit that drives DME is reflected in all their SPM products and helps them to deliver instruments that have the minimum of complexity but give the maximum performance.

Applications: below are a few examples, more can be found here.

Data storage

Optical characterisation - Topographical (left) and near-field optical (right) images.

Materials science

Once you have defined your research area and requirements, we put together an SPM system for you that is designed to meet your needs. All of our scanners, controllers, and stages can be integrated into unique configurations designed to scan, image and measure the sample surface you want to characterise.

Because not everyone needs an "off the shelf" instrument we are also able to offer highly customised solutions such as the PolyScope UHV STM and the CAHT controlled atmosphere at high temperature SPM – for more information please contact us to discss your requirements.