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APPLICATIONS
-Nanoscale surface science
-Nanoscale topography
-Microscale topography
-Flatness/Waviness
-Thin-film characterisation
-Surface manipulation

PRODUCTS
-DualScope
-MicroXAM
-MiniFIZ
-OSP100/500
-Alpha-Step/P-16+
-nkd7000/8000
-uPG101/DWL66

TECHNOLOGIES
- SPM
- White light interferometry
- Laser interferometry
- Laser/confocal scanning
- Stylus profiling
- Spectrophotometry
- Laser lithography

CONTACT

Click on one of the above

Welcome to Omniscan a new supplier of leading edge surface analysis instrumentation and metrology solutions to industry and academia.

We provide instrumentation and consulting for measurement of surface roughness, waviness and shape; layer thickness and optical properties ranging from the sub-nanometer to the cm scales along with surface modification and laser lithography.

CONTACT US

Click here to email us for more information, or to send us your comments, or call us on 01978-844155.

This site features information about:
3D non-contact surface metrology instrumentation, 3D profiling, asperity, bearing ratios, confocal scanning, defect analysis, Fizeau Interferometers, focal scanning microscopes, interferometers, laser texture analysis, interferometry, measuring instruments, metrology, microscopes, non-destructive testing, NDT, optical testing, phase shifting white light interferometers, polish enhanced defect analysis, process control, process enhanced defect analysis, profiling, profilers, quality control, roughness, surface, surface metrology, surface roughness measurements, texture analysis measurements, microwaviness, waviness, and wavefront transmission, SPM, AFM, atomic force microscope, scaning tunneling microscope.